80 Orville Dr. Suite 100-10131, Bohemia, NY 11716 1-631-869-4956 1-631-910-2166

Tools and Supplies

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Tools and Supplies

High quality tools and supplies are very helpful in scientific experiments. It guarantees the reliability and accuracy of your research findings. Please explore a full line of our laboratory tools, equipment and supplies below. Whether you’re looking for microscopy standard sample, or other instruments, you will find it here. Matexcel is committed to providing the highest quality products along with competitive pricing, prompt delivery and outstanding customer service.

CAT.NO. Product Name Feature Inquiry
ASS-760 Microscopy Reference Standard 760 Pitch: 292nm Surface feature: Titanium lines Substrate: Silicon Mounting: Mounted (Customized) Inquiry
ASS-761 Microscopy Reference Standard 761 Pitch: 292nm Surface feature: Titanium lines Substrate: Silicon Mounting: Mounted (15mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight) Inquiry
ASS-762 Microscopy Reference Standard 762 Pitch: 292nm Surface feature: Titanium lines Substrate: Silicon Mounting: Mounted (25mm dia. x 6mm Cylinder, M4 Hitachi, Agilent / Keysight) Inquiry
ASS-763 Microscopy Reference Standard 763 Pitch: 292nm Surface feature: Titanium lines Substrate: Silicon Mounting: Mounted (12.2mm dia. x 10mm Cylinder, JEOL_ Inquiry
ASS-764 Microscopy Reference Standard 764 Pitch: 292nm Surface feature: Titanium lines Substrate: Silicon Mounting: Mounted (31.7mm dia. x 6.47mm, Cambridge S4 Mount) Inquiry
ASS-765 Microscopy Reference Standard 765 Pitch: 292nm Surface feature: Titanium lines Substrate: Silicon Mounting: Pin Mounted (12.7mm dia. x 15.7mm height, AMRAY special slotted head) Inquiry
ASS-766 Microscopy Reference Standard 766 Pitch: 292nm Surface feature: Titanium lines Substrate: Silicon Mounting: Mounted (25mm dia. x 10mm Cylinder, JEOL) Inquiry
ASS-767 Microscopy Reference Standard 767 Pitch: 292nm Surface feature: Titanium lines Substrate: Silicon Mounting: Pin Mounted (Head dia.=25.4mm; pin=3.2mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom) Inquiry
SEM-783 Microscopy Reference Standard 767 Pitch: 5-150nm Surface feature: Gold particle Substrate: Graphite Mounting: Pin Mounted Inquiry
SEM-784 Microscopy Reference Standard 784 Pitch: 5-150nm Surface feature: Gold particle Substrate: Graphite Mounting: JEOL Mounted Inquiry

Contact Us

80 Orville Dr. Suite 100-10131, Bohemia, NY 11716

USA: 1-631-869-4956

Fax: 1-631-910-2166

Email: info@matexcel.com

Contact Us

80 Orville Dr. Suite 100-10131, Bohemia, NY 11716

USA: 1-631-869-4956

Fax: 1-631-910-2166

Email: info@matexcel.com

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