80 Orville Dr. Suite 100-10131, Bohemia, NY 11716 1-631-869-4956 1-631-910-2166

Tools and Supplies

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Tools and Supplies

High quality tools and supplies are very helpful in scientific experiments. It guarantees the reliability and accuracy of your research findings. Please explore a full line of our laboratory tools, equipment and supplies below. Whether you’re looking for microscopy standard sample, or other instruments, you will find it here. Matexcel is committed to providing the highest quality products along with competitive pricing, prompt delivery and outstanding customer service.

CAT.NO. Product Name Feature Inquiry
ASS-824 Microscopy Reference Standard 824 Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon (4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. ) Mounting: Unmounted Inquiry
ASS-825 Microscopy Reference Standard 825 Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted JEOL 3/8\" (9.5 mm) round mounts x 9.5 mm high Inquiry
ASS-826 Microscopy Reference Standard 826 Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on Topcon 15 mm round mounts, 10 mm high Inquiry
ASS-827 Microscopy Reference Standard 827 Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted mounted FEI/Leica/LEO/Cambridge/Philips Pin-Type Mount 12.7(table)X3.2(pin)X 8.0mm(length) Inquiry
ASS-828 Microscopy Reference Standard 828 Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on AMRAY Pin-Type Mount 12.7 (table)X3.2(pin)X 15mm (length) Inquiry
ASS-829 Microscopy Reference Standard 829 Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on Universal 1\" (25.4 mm) round x 20 mm high Inquiry
ASS-830 Microscopy Reference Standard 830 Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on Hitachi Threaded Mount, 26 mm round, 6 mm Inquiry
AFM-831 Microscopy Reference Standard 831 Pitch: 145nm Surface feature: Aluminum lines Substrate: Glass (4x6 mm. Line height (about 100 nm) and line width (about 75 nm) are not calibrated.) Mounting: Unmounted Inquiry
ASS-832 Microscopy Reference Standard 832 Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon (4x3 mm die. Bump height (about 100 nm) is not calibrated.) Mounting: Unmounted Inquiry
ASS-833 Microscopy Reference Standard 833 Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon (4x3 mm die. Bump height (about 100 nm) is not calibrated.) Mounting: Unmounted Inquiry

Contact Us

80 Orville Dr. Suite 100-10131, Bohemia, NY 11716

USA: 1-631-869-4956

Fax: 1-631-910-2166

Email: info@matexcel.com

Contact Us

80 Orville Dr. Suite 100-10131, Bohemia, NY 11716

USA: 1-631-869-4956

Fax: 1-631-910-2166

Email: info@matexcel.com

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