Tools and Supplies, Products - Page 6

Tools and Supplies

High quality tools and supplies are very helpful in scientific experiments. It guarantees the reliability and accuracy of your research findings. Please explore a full line of our laboratory tools, equipment and supplies below. Whether you’re looking for microscopy standard sample, or other instruments, you will find it here. Matexcel is committed to providing the highest quality products along with competitive pricing, prompt delivery and outstanding customer service.

CAT.NO.	Product Name	Feature	Inquiry
ASS-824	Microscopy Reference Standard 824	Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon (4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. ) Mounting: Unmounted	Inquiry
ASS-825	Microscopy Reference Standard 825	Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted JEOL 3/8\" (9.5 mm) round mounts x 9.5 mm high	Inquiry
ASS-826	Microscopy Reference Standard 826	Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on Topcon 15 mm round mounts, 10 mm high	Inquiry
ASS-827	Microscopy Reference Standard 827	Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted mounted FEI/Leica/LEO/Cambridge/Philips Pin-Type Mount 12.7(table)X3.2(pin)X 8.0mm(length)	Inquiry
ASS-828	Microscopy Reference Standard 828	Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on AMRAY Pin-Type Mount 12.7 (table)X3.2(pin)X 15mm (length)	Inquiry
ASS-829	Microscopy Reference Standard 829	Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on Universal 1\" (25.4 mm) round x 20 mm high	Inquiry
ASS-830	Microscopy Reference Standard 830	Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on Hitachi Threaded Mount, 26 mm round, 6 mm	Inquiry
AFM-831	Microscopy Reference Standard 831	Pitch: 145nm Surface feature: Aluminum lines Substrate: Glass (4x6 mm. Line height (about 100 nm) and line width (about 75 nm) are not calibrated.) Mounting: Unmounted	Inquiry
ASS-832	Microscopy Reference Standard 832	Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon (4x3 mm die. Bump height (about 100 nm) is not calibrated.) Mounting: Unmounted	Inquiry
ASS-833	Microscopy Reference Standard 833	Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon (4x3 mm die. Bump height (about 100 nm) is not calibrated.) Mounting: Unmounted	Inquiry