High quality tools and supplies are very helpful in scientific experiments. It guarantees the reliability and accuracy of your research findings. Please explore a full line of our laboratory tools, equipment and supplies below. Whether you’re looking for microscopy standard sample, or other instruments, you will find it here. Matexcel is committed to providing the highest quality products along with competitive pricing, prompt delivery and outstanding customer service.
| CAT.NO. | Product Name | Feature | Inquiry |
|---|---|---|---|
| ASS-824 | Microscopy Reference Standard 824 | Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon (4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. ) Mounting: Unmounted | Inquiry |
| ASS-825 | Microscopy Reference Standard 825 | Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted JEOL 3/8\" (9.5 mm) round mounts x 9.5 mm high | Inquiry |
| ASS-826 | Microscopy Reference Standard 826 | Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on Topcon 15 mm round mounts, 10 mm high | Inquiry |
| ASS-827 | Microscopy Reference Standard 827 | Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted mounted FEI/Leica/LEO/Cambridge/Philips Pin-Type Mount 12.7(table)X3.2(pin)X 8.0mm(length) | Inquiry |
| ASS-828 | Microscopy Reference Standard 828 | Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on AMRAY Pin-Type Mount 12.7 (table)X3.2(pin)X 15mm (length) | Inquiry |
| ASS-829 | Microscopy Reference Standard 829 | Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on Universal 1\" (25.4 mm) round x 20 mm high | Inquiry |
| ASS-830 | Microscopy Reference Standard 830 | Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on Hitachi Threaded Mount, 26 mm round, 6 mm | Inquiry |
| AFM-831 | Microscopy Reference Standard 831 | Pitch: 145nm Surface feature: Aluminum lines Substrate: Glass (4x6 mm. Line height (about 100 nm) and line width (about 75 nm) are not calibrated.) Mounting: Unmounted | Inquiry |
| ASS-832 | Microscopy Reference Standard 832 | Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon (4x3 mm die. Bump height (about 100 nm) is not calibrated.) Mounting: Unmounted | Inquiry |
| ASS-833 | Microscopy Reference Standard 833 | Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon (4x3 mm die. Bump height (about 100 nm) is not calibrated.) Mounting: Unmounted | Inquiry |
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