Tools and Supplies, Products - Page 7

Tools and Supplies

High quality tools and supplies are very helpful in scientific experiments. It guarantees the reliability and accuracy of your research findings. Please explore a full line of our laboratory tools, equipment and supplies below. Whether you’re looking for microscopy standard sample, or other instruments, you will find it here. Matexcel is committed to providing the highest quality products along with competitive pricing, prompt delivery and outstanding customer service.

CAT.NO.	Product Name	Feature	Inquiry
ASS-834	Microscopy Reference Standard 834	Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted 4x3 mm die. Bump height (about 100 nm) is not calibrated.	Inquiry
ASS-835	Microscopy Reference Standard 835	Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted on mounted on FEI/Leica/LEO/Cambridge/Philips Pin-Type Mount 25.4 tableX3.2 diaX7.5mm	Inquiry
ASS-836	Microscopy Reference Standard 836	Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted on AMRAY Pin-Type Mount 12.7 (table)X3.2(pin diameter)X15mm (pin length)	Inquiry
ASS-837	Microscopy Reference Standard 837	Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted on Universal 1\" (25.4 mm) round x 20 mm high	Inquiry
ASS-838	Microscopy Reference Standard 838	Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted on Hitachi Threaded Mount, 26 mm round, 6 mm	Inquiry
ASS-839	Microscopy Reference Standard 839	Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted on 12mm Steel Disk	Inquiry
ASS-840	Microscopy Reference Standard 840	Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on 12 mm Steel Disk	Inquiry
ASS-841	Microscopy Reference Standard 841	Pitch: 292 nm Surface feature: Titanium lines Substrate: Silicon (3 x 4mm. Line height: approximately 30 nm (not calibrated). Line width: Approximately 130 nm (not calibrated). Mounting: Unmounted	Inquiry
ASS-842	Microscopy Reference Standard 842	Pitch: 292 nm Surface feature: Titanium lines Substrate: Silicon (3 x 4mm. Line height: approximately 30 nm (not calibrated). Line width: Approximately 130 nm (not calibrated).) Mounting: Unmounted or mounted on 12 mm steel disks	Inquiry
ASS-844	Microscopy Reference Standard 844	Pitch: 292 nm Surface feature: Titanium lines Substrate: Silicon (3 x 4mm. Line height: approximately 30 nm (not calibrated). Line width: Approximately 130 nm (not calibrated).) Mounting: FEI 1506 Pin-Mounted	Inquiry