High quality tools and supplies are very helpful in scientific experiments. It guarantees the reliability and accuracy of your research findings. Please explore a full line of our laboratory tools, equipment and supplies below. Whether you’re looking for microscopy standard sample, or other instruments, you will find it here. Matexcel is committed to providing the highest quality products along with competitive pricing, prompt delivery and outstanding customer service.
| CAT.NO. | Product Name | Feature | Inquiry |
|---|---|---|---|
| ASS-834 | Microscopy Reference Standard 834 | Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted 4x3 mm die. Bump height (about 100 nm) is not calibrated. | Inquiry |
| ASS-835 | Microscopy Reference Standard 835 | Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted on mounted on FEI/Leica/LEO/Cambridge/Philips Pin-Type Mount 25.4 tableX3.2 diaX7.5mm | Inquiry |
| ASS-836 | Microscopy Reference Standard 836 | Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted on AMRAY Pin-Type Mount 12.7 (table)X3.2(pin diameter)X15mm (pin length) | Inquiry |
| ASS-837 | Microscopy Reference Standard 837 | Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted on Universal 1\" (25.4 mm) round x 20 mm high | Inquiry |
| ASS-838 | Microscopy Reference Standard 838 | Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted on Hitachi Threaded Mount, 26 mm round, 6 mm | Inquiry |
| ASS-839 | Microscopy Reference Standard 839 | Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted on 12mm Steel Disk | Inquiry |
| ASS-840 | Microscopy Reference Standard 840 | Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on 12 mm Steel Disk | Inquiry |
| ASS-841 | Microscopy Reference Standard 841 | Pitch: 292 nm Surface feature: Titanium lines Substrate: Silicon (3 x 4mm. Line height: approximately 30 nm (not calibrated). Line width: Approximately 130 nm (not calibrated). Mounting: Unmounted | Inquiry |
| ASS-842 | Microscopy Reference Standard 842 | Pitch: 292 nm Surface feature: Titanium lines Substrate: Silicon (3 x 4mm. Line height: approximately 30 nm (not calibrated). Line width: Approximately 130 nm (not calibrated).) Mounting: Unmounted or mounted on 12 mm steel disks | Inquiry |
| ASS-844 | Microscopy Reference Standard 844 | Pitch: 292 nm Surface feature: Titanium lines Substrate: Silicon (3 x 4mm. Line height: approximately 30 nm (not calibrated). Line width: Approximately 130 nm (not calibrated).) Mounting: FEI 1506 Pin-Mounted | Inquiry |
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