80 Orville Dr. Suite 100-10131, Bohemia, NY 11716 1-631-869-4956 1-631-910-2166

Tools and Supplies

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Tools and Supplies

High quality tools and supplies are very helpful in scientific experiments. It guarantees the reliability and accuracy of your research findings. Please explore a full line of our laboratory tools, equipment and supplies below. Whether you’re looking for microscopy standard sample, or other instruments, you will find it here. Matexcel is committed to providing the highest quality products along with competitive pricing, prompt delivery and outstanding customer service.

CAT.NO. Product Name Feature Inquiry
ASS-834 Microscopy Reference Standard 834 Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted 4x3 mm die. Bump height (about 100 nm) is not calibrated. Inquiry
ASS-835 Microscopy Reference Standard 835 Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted on mounted on FEI/Leica/LEO/Cambridge/Philips Pin-Type Mount 25.4 tableX3.2 diaX7.5mm Inquiry
ASS-836 Microscopy Reference Standard 836 Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted on AMRAY Pin-Type Mount 12.7 (table)X3.2(pin diameter)X15mm (pin length) Inquiry
ASS-837 Microscopy Reference Standard 837 Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted on Universal 1\" (25.4 mm) round x 20 mm high Inquiry
ASS-838 Microscopy Reference Standard 838 Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted on Hitachi Threaded Mount, 26 mm round, 6 mm Inquiry
ASS-839 Microscopy Reference Standard 839 Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted on 12mm Steel Disk Inquiry
ASS-840 Microscopy Reference Standard 840 Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon Mounting: Mounted on 12 mm Steel Disk Inquiry
ASS-841 Microscopy Reference Standard 841 Pitch: 292 nm Surface feature: Titanium lines Substrate: Silicon (3 x 4mm. Line height: approximately 30 nm (not calibrated). Line width: Approximately 130 nm (not calibrated). Mounting: Unmounted Inquiry
ASS-842 Microscopy Reference Standard 842 Pitch: 292 nm Surface feature: Titanium lines Substrate: Silicon (3 x 4mm. Line height: approximately 30 nm (not calibrated). Line width: Approximately 130 nm (not calibrated).) Mounting: Unmounted or mounted on 12 mm steel disks Inquiry
ASS-844 Microscopy Reference Standard 844 Pitch: 292 nm Surface feature: Titanium lines Substrate: Silicon (3 x 4mm. Line height: approximately 30 nm (not calibrated). Line width: Approximately 130 nm (not calibrated).) Mounting: FEI 1506 Pin-Mounted Inquiry

Contact Us

80 Orville Dr. Suite 100-10131, Bohemia, NY 11716

USA: 1-631-869-4956

Fax: 1-631-910-2166

Email: info@matexcel.com

Contact Us

80 Orville Dr. Suite 100-10131, Bohemia, NY 11716

USA: 1-631-869-4956

Fax: 1-631-910-2166

Email: info@matexcel.com

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