80 Orville Dr. Suite 100-10131, Bohemia, NY 11716 1-631-869-4956 1-631-910-2166

Microscopy Reference Standard 850

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Microscopy Reference Standard 850
Product Infomation
Cat.No. ASS-850
Product Name Microscopy Reference Standard 850
Description Pitch: 700 nm
Surface feature: Hardened photoresist ridges covered with Tungsten
Substrate: Silicon (3 x 4mm.
Line height: approximately 30 nm (not calibrated).
Line width: Approximately 130 nm (not calibrated).)
Mounting: Unmounted
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80 Orville Dr. Suite 100-10131, Bohemia, NY 11716

USA: 1-631-869-4956

Fax: 1-631-910-2166

Email: info@matexcel.com

Contact Us

80 Orville Dr. Suite 100-10131, Bohemia, NY 11716

USA: 1-631-869-4956

Fax: 1-631-910-2166

Email: info@matexcel.com

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