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Product Infomation | |
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Catalog Number | ASS-850 |
Product Name | Microscopy Reference Standard 850 |
Description | Pitch: 700 nm Surface feature: Hardened photoresist ridges covered with Tungsten Substrate: Silicon (3 x 4mm. Line height: approximately 30 nm (not calibrated). Line width: Approximately 130 nm (not calibrated).) Mounting: Unmounted |