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We can offer a discount on bulk orders. Please contact our sales team for further inquiry.| Product Infomation | |
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| Product Name | Microscopy Reference Standard 834 |
| Catalog Number | ASS-834 |
| Description | Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted 4x3 mm die. Bump height (about 100 nm) is not calibrated. |