Microscopy Reference Standard 824

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Microscopy Reference Standard 824
Product Infomation
Cat.No. ASS-824
Product Name Microscopy Reference Standard 824
Description Pitch: 70 nm
Surface feature: Silicon Oxide ridges
Substrate: Silicon (4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. )
Mounting: Unmounted
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