Product Infomation | |
Cat.No. | ASS-824 |
Product Name | Microscopy Reference Standard 824 |
Description | Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon (4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. ) Mounting: Unmounted |
![]() |
Online Inquiry
Welcome! For price inquiries, please feel free to contact us through the form on the left side. We will get back to you as soon as possible.