| Product Infomation | |
| Cat.No. | ASS-824 |
| Product Name | Microscopy Reference Standard 824 |
| Description | Pitch: 70 nm Surface feature: Silicon Oxide ridges Substrate: Silicon (4x3 mm die. Ridge height (about 35 nm) and width (about 35 nm) are not calibrated. ) Mounting: Unmounted |
 Download Datasheet |
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80 Orville Dr. Suite 100-10131, Bohemia, NY 11716
USA: 1-631-869-4956
Fax: 1-631-910-2166
Email: