Microscopy Reference Standard 809

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Microscopy Reference Standard 809
Product Infomation
Cat.No. ASS-809
Product Name Microscopy Reference Standard 809
Description Pitch: 144nm
Surface feature: Aluminum bumps
Substrate: Silicon (4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.)
Mounting: Mounted on JEOL 3/8" (9.5 mm) round mounts x 9.5 mm high
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