80 Orville Dr. Suite 100-10131, Bohemia, NY 11716 1-631-869-4956 1-631-910-2166

Materials Analysis Services

We provide the most professional service in materials science

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Materials Analysis Services

The characterization of materials is an important step in understanding the structure-property relationship. It is also crucial for process/quality control and product development, once the materials properties (physical, chemical, mechanical, etc.) are determined, this information can be used to solve process-related or product failure problems. Materials characterization is usually done with a variety of techniques, including different forms of microscopy (light, electron, acoustic, etc.,) and analysis (microanalysis and surface analytical techniques), the resulting information can be processed to yield images or spectra which reveal the topographic, geometric, structural, physical or chemical details of the material. For surface analysis, electron microscopy is capable of imaging at low magnification for surface surveys and ultra-high magnification for investigation of nano-scale features. For organic/inorganic materials, chromatography techniques are widely used in separation and identification of components in mixture. For nanomaterials, the characterization is generally done with a probe which may consist of photons, electrons, neutrons, ions, or physical sharp tips. At Matexcel, our scientists and professionals with years of experience provide a complete list of materials testing services and professional results interpretation for our clients. We offer laboratory services which include, but not limited to:

• Electron Microscopy (EM): Scanning electron microscopy (SEM), Focused ion beam scanning electron microscopy (FIB-SEM), Energy dispersive X-Rays (EDX), Transmission electron microscopy (TEM), S/TEM tomography, Cryo-EM.
• Chemical composition: Fourier transform infrared spectroscopy (FTIR), Raman spectroscopy, Nuclear magnetic resonance (NMR), Gas chromatography-mass spectrometry (GC-MS), Liquid chromatography-mass spectrometry (LC-MS), Inductively coupled plasma-optical emission spectroscopy (ICP-OES), ICP-MS, X-Ray fluorescence (XRF).
• Surface Analysis: X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), Secondary ion mass spectrometry (SIMS), Atomic force microscopy (AFM), Ellipsometry, Grazing-incidence small-angle X-ray scattering (GI-SAXS), Contact angle goniometers.
• Size/molecular weight analysis: Gel permeation chromatography-light scattering (GPC-LS), Dynamic light scattering (DLS).
• Thermal/mechanical analysis: Thermogravimetric analysis (TGA), Differential scanning calorimetry (DSC), Dynamic mechanical analysis (DMA), Thermomechanical analysis (TMA), Rheometer, Tensile tester, Nanoindentor.
• Other facilities: X-ray diffraction (XRD), Ultraviolet/Visible (UV/Vis) spectroscopy, Circular dichroism (CD) spectroscopy, Microplate reader, Confocal microscopy.

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80 Orville Dr. Suite 100-10131, Bohemia, NY 11716

USA: 1-631-869-4956

Fax: 1-631-910-2166

Email: info@matexcel.com

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