| Product Infomation | |
| Cat.No. | ASS-834 |
| Product Name | Microscopy Reference Standard 834 |
| Description | Pitch: 297 nm Surface feature: Aluminum bumps Substrate: Silicon Mounting: Mounted 4x3 mm die. Bump height (about 100 nm) is not calibrated. |
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80 Orville Dr. Suite 100-10131, Bohemia, NY 11716
USA: 1-631-869-4956
Fax: 1-631-910-2166
Email: