| Product Infomation | |
| Cat.No. | ASS-807 |
| Product Name | Microscopy Reference Standard 807 |
| Description | Pitch: 144nm Surface feature: Aluminum bumps Substrate: Silicon (4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.) Mounting: Unmounted or unmounted on 12 mm steel disks |
 Download Datasheet |
|
Online Inquiry
Welcome! For price inquiries, please feel free to contact us through the form on the left side. We will get back to you as soon as possible.
Email:
Email: