| Product Infomation | |
| Cat.No. | ASS-767 |
| Product Name | Microscopy Reference Standard 767 |
| Description | Pitch: 292nm Surface feature: Titanium lines Substrate: Silicon Mounting: Pin Mounted (Head dia.=25.4mm; pin=3.2mm, FEI/Philips, Cambridge, Leica, TESCAN, CAMSCAN, ASPEX, Phenom) |
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80 Orville Dr. Suite 100-10131, Bohemia, NY 11716
USA: 1-631-869-4956
Fax: 1-631-910-2166
Email: